Thermal Resistance Tester               


The TESEC Thermal Resistance ΔVGS Tester Model 4408-KT measures thermal resistance for Compound semiconductor(GaN/GaAs FET/HEMT) as ΔVGS resulting from the temperature rise during power forcing, compares ΔVGS with limits, decides the result for binning, and displays VGS1, VGS2 and ΔVGS on the LCD panel.
By inputting a thermal coefficient to the tester, it directly displays the raised temperature of the junction.
The tester is furnished with the functions of the contact check and the oscillation detection to prevent measurement errors caused by contact failures and oscillation for improved testing reliability.
In addition, the tester has a device protection circuit which prevents devices from being damaged at the start of an avalanche.




♦It is designed for Compound semiconductor(GaN/GaAs FET/HEMT).


♦Both Enhancement mode and Depletion mode is available.


♦High power force VDS:70Vmax,ID:20Amax,Power:350W/500ms)

♦The optimum for GaN, GaAs or RF Power devices of cellular

  base-station, satellite communications and broadcast.


♦Multi-testing can be performed.


♦The contact check function prevents measurement errors and

  mis-binning due to contact failure.


♦GATE LIMIT voltage for MOSFET measurement can be set and the

  tester is furnished with a device protection circuit from overheating.

♦The tester can be controlled externally through the GP-IB or


  RS-232-C interface.


♦The functional check can be conducted by using 4321-AB(Option).





Forcing VoltageVDS

01.0 70.0V

Forcing CurrentID)

00.01 20.00A

Measuring CurrentIM)

000.1 999.9mA

Gate Forcing VoltageVGS


Power Forcing TimePT)

100us 9.99s

Delay TimeDT)

010 999us

Lower Limit


Upper Limit


Measurement Range

 VGS1: 0000.0 2000.0 mV   VGS: 0000.0999.9 mV

*The attached picture is the special version which has the DUT connection at upper part of

  Head Box.  

*For details specification of each product, please contact us.







Event Calender

Latest News

>> View All