4408-KT
Thermal Resistance Tester
TESEC Thermal Resistance ΔVGS Tester Model 4408-KT measures thermal resistance for Compound semiconductor(GaN/GaAs FET/HEMT) as ΔVGS, which as as a result from temperature rise during heating, and judging this ΔVGS result with limits, before going for bin sorting process. VGS1 and ΔVGS results will be displayed on LCD panel at the end of testing process.
By inputting a thermal coefficient to the tester, it's directly displaying the raise of junction temperature for the DUT. Equiped with functions of contact check and oscillation detection, this tester is able to prevent measurement errors caused by contact failures and also oscillation respectively.
Beside this, the tester has device protection circuit which is able to prevents devices from being damaged when avalanche occurred.
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Features |
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♦For Compound semiconductor(GaN/GaAs FET/HEMT). |
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♦Available for both Enhancement & Depletion mode. |
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♦High power force (VDS:70V,ID:20A,Power:350W/500ms) |
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♦Optimize for GaN, GaAs or RF Power devices of cellular |
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based station, satellite communications and broadcast. |
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♦Multiple tests can be performed. |
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♦Allow to set GATE LIMIT voltage. |
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♦Equiped with device protection circuit from overheating. |
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♦ External controlled : By GP-IB or RS-232-C interface. |
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♦ Functionality check : By 4321-AB. |
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Model |
4408-KT |
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Forcing Voltage（VDS） |
01.0～ 70.0V |
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Forcing Current（ID) |
00.01～ 20.00A |
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Measuring Current（IM) |
000.1～ 999.9mA |
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Gate Forcing Voltage（VGS） |
00.1～10.0V |
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Power Forcing Time（PT) |
100us ～ 9.99s |
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Delay Time（DT) |
010 ～ 999us |
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Lower Limit |
000.0～999.9ｍＶ |
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Upper Limit |
000.0～999.9ｍＶ |
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Measurement Range |
VGS1: 0000.0 ～ 2000.0 mV △VGS: 0000.0～999.9 mV |
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*The attached picture is the special version which has the DUT connection at upper part of Head Box. |
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*For details specification of each product, please contact us.
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