471-TT
Discrete Device Test System
471-TT Parallel Tester for Wafer test
Parallel tests is the main factor to achieve mass production. With up to max 16 sites can be configured for parallel test, this what Tesec new 471-TT DC is able to bring about mass production to wafer test process. With accumulated experience in high-voltage and current for discrete test, this has become our key advantages to this tester model.
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Features |
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♦ Improved cost performance through parallel test of multiple chips (8 /16 parallel). |
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♦Communication time is significantly improve |
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through utilisation of LAN technology |
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♦Measurement time is greatly reduced through |
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shorter of relay switching time |
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Model |
471-TT/S(8-sites) / 471-TT/D(16-sites) |
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Applicable Devices |
Transistor, Diode, FET, IGBT, SiC, GaN etc. |
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Polarity |
NPN / PNP, N/P Channel |
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Operating System |
Windows |
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Test Mode |
Parallel 8 / 16 ( Photo ) |
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Data Display (Bias) |
3 digits |
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Data Display (Measure) |
4 digits |
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Test Stations |
1 Station |
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Max Voltage |
2kV |
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Max Current |
20A(Note*1) |
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Test Item |
500 |
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Sort Item |
250 |
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Note *1. Currently can be extended up to 30A, kindly contact us for details. |
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