341-TT/P 351-TT/P

Discrete Device Test System      

 

The 341-TT/P and 351-TT/P have a capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing. 
 

Features

                 

♦2kV/50A Capability in Main Frame (351-TT/P)

http://en.tesec.co.jp/products/discrete/351ttp/?action=common_download_main&upload_id=697

 
       

 

♦Parallel Test Capability

             

♦Programmable Forcing Timing

           
                   

Test Method

               

♦TBB : Test By Branch

             

♦TBS : Test By Sort

             

♦Parallel/Serial Test

             

♦2 points Judgment

             
                   

Software Options

               

♦Conversion software to CSV file format which

         

 

  can be used for data analysis on Excel

 

351-TT/P

       

♦Wafer map display software

             

♦Lot process function (available for customizing)

         

 

♦Tester control function from an extended unit by RS232C

       

 

                               

 

MODEL

351-TT/P

341-TT/P

 

Applicable Devices

Transistor, Diode, Zener Diode, MOSFET, Dual Gate FET,

Voltage Regulator, Opto-Coupler, SCR, Triac, IGBT

 
 

 Host CPU

Personal Computer

 

 Operating System

Microsoft(R) Windows(R)

 

 Test Mode

Serial/Parallel

 

 Data Display

4-digit

 

 Test Stations

2x 4

 

 Max Voltage

2,000V

1,200V

 

(*3000V/5000V Option) 

(*3000V/5000V Option) 

 

 Max Current

50A

20A

 

(*100A/200A/300A/600A/1,200A Option)

(*50A/100A/200A/300A/600A/1,200A Option)

 

 Test Plan

500

 

 Sort Plan

250

 

*Microsoft, Windows are registered trademarks of Microsoft Corporation.

 

*For details specification of each product, please contact us.

 

 

 

                     

   


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