881-TT/A 381-TT/P

Discrete Device Test System      

The 881-TT/A is a high performance test system which covers wide range of discrete semiconductor devices from small signal devices to power devices. As the most popular tester in the world corresponding to the steady progress of semiconductor devices in specifications and performance,

881-TT/A has received high estimation in its reliability.





♦1kV/20A Capability in Main Frame


♦Parallel Test Capability (381-TT/P)


Test Method


♦TBB : Test By Branch


♦TBS : Test By Sort


Software Options


♦Conversion software to CSV file format which


  can be used for data analysis on Excel


♦Wafer map display software


♦Lot process function (available for customizing)


Text Box: 381-TT/P


♦Tester control function from an extended


  unit by RS232C









Applicable Devices

Transistor, Diode, Zener Diode, MOSFET, Dual Gate FET,        Voltage Regulator, Opto-Coupler, SCR, Triac, IGBT


Host CPU

Personal Computer


Operating System 

Microsoft(R) Windows(R)


Test Mode




Data Display



Test Stations

1x 5

2x 2


Max Voltage

999V(*3000V/5000V option)


Max Current

20A(*100A/200A/300A/600A/1,200A option)


Test Plan



Sort Plan



*Microsoft, Windows are registered trademarks of Microsoft Corporation.


*For details specification of each product, please contact us.







Event Calender

Latest News

>> View All