881-TT/A 381-TT/P

Discrete Device Test System      


The 881-TT/A is a high performance test system which covers wide range of discrete semiconductor devices from small signal devices to power devices. As the most popular tester in the world corresponding to the steady progress of semiconductor devices in specifications and performance,

881-TT/A has received high estimation in its reliability.
 

Features

 

 

 
           

♦1kV/20A Capability in Main Frame

             

♦Parallel Test Capability (381-TT/P)

           
                 

Test Method

               

♦TBB : Test By Branch

               

♦TBS : Test By Sort

               
                 

Software Options

               

♦Conversion software to CSV file format which

           

  can be used for data analysis on Excel

             

♦Wafer map display software

               

♦Lot process function (available for customizing)

   

Text Box: 381-TT/P

     

♦Tester control function from an extended

             

  unit by RS232C

               

 
               
                 
                 
                 
                 
                 
                 
                 
                 
                 

 

 

 Model

881-TT/A

381-TT/P

 

Applicable Devices

Transistor, Diode, Zener Diode, MOSFET, Dual Gate FET,        Voltage Regulator, Opto-Coupler, SCR, Triac, IGBT

 
 

Host CPU

Personal Computer

 

Operating System 

Microsoft(R) Windows(R)

 

Test Mode

Single

Parallel

 

Data Display

4-digit

 

Test Stations

1x 5

2x 2

 

Max Voltage

999V(*3000V/5000V option)

 

Max Current

20A(*100A/200A/300A/600A/1,200A option)

 

Test Plan

250

 

Sort Plan

250

 

*Microsoft, Windows are registered trademarks of Microsoft Corporation.

 

*For details specification of each product, please contact us.

 

 

 

                      

 


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