431-TT

Discrete Device Test System                

 

The Model 431-TT is Tesec’s newest DC Parametric Test System which employs a new Architecture with V/I Source Measurement Modules. 
The 431-TT is designed for Power Device testing and features high-speed test measurement and data capture, parallel device testing, auto-calibration, and an on-screen Waveform Monitor.
 

FEATURES

  

   

 

 
       

♦VI Source Measure Modules Structure

          

♦1.2KV、65A (C-E 130A, 200A option）

          

 Capability in Main Frame

              

♦High Speed Measurement

              

♦Multi devices Measurement

              

♦Wafer Parallel Measurement

            

♦Auto Calibration Function

              

♦On Screen Waveform Monitor

            

♦High Current Unit, High Voltage Unit as option

         

 

 

 

 

 Model

  431-TT

  

Applicable Devices

Transistor, Diode, Zener Diode, MOSFET, Dual Gate FET, 

Voltage Regulator, Opto-Coupler, SCR, Triac, IGBT

  
 

　Host CPU

Personal Computer

  

　Operating System 

Windows

  

　Test Mode

Parallel

  

　Data Display (Bias)

4-digit

  

　Data Display (Measure)

5-digit

  

　Test Stations

2 Station/Analog Unit(4 Stations as option)

  

　Max Voltage

1.2kV (2kV mainframe / 5kV external unit as option)

  

　Max Current

65A, for C-E 130A (200A option)  (1200A external as option unit)

  

　Test Item

999

  

　Sort Item 

250

  

*Maximum Current is limited to 50A for usage of 5kV unit.

  

*For details specification of each product, please contact us.

 

 

 

                     

 

 

 

 

 

 


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