431-TT

Discrete Device Test System                

 

431-TT is Tesec’s DC Parametric Test System which employs architecture of V/I Source Measurement Modules. 

With upto 2KV/200A spec for standard tester, it was designed for Power Device testing.

This tester comes with features like high-speed leak test, true parallel device testing, auto-calibration and an on-screen Waveform Monitor.

 

FEATURES

 

 

  

     

♦VI Source Measure Modules Structure

    

♦1.2KV、65A (C-E 130A, 200A option）capability

♦ High speed leak test

♦Multi devices Measurement

♦Wafer Parallel Measurement

♦Auto Calibration Function

♦On Screen Waveform Monitor

♦5KV/1200A as an external option


 

    

 

 

 

 

        

 

 

 

 

 

 Model

  431-TT

  

Applicable Devices

Transistor, Diode, Zener Diode, MOSFET, Dual Gate FET, 

Voltage Regulator, Opto-Coupler, SCR, Triac, IGBT, SiC, GaN & etc

  
 

　Host CPU

Personal Computer

  

　Operating System 

Windows

  

　Test Mode

Parallel

  

　Data Display (Bias)

4-digit

  

　Data Display (Measure)

5-digit

  

　Test Stations

2 Station/Analog Unit(4 Stations as option)

  

　Max Voltage

1.2kV/2kV mainframe, with 5kV as an external option)

  

　Max Current

65A, for C-E 130A (200A built in option,1200A as an external option)

  

　Test Item

999

  

　Sort Item 

250

  

*Maximum Current is limited to 50A for usage of 5kV unit.

  

*For details specification of each product, please contact us.

 

 

 

                     

 

 

 


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