Dynamic Test System

3430-SW

 

The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items (normal 2stations). One PC controls the whole system.

         

 

 
       
                   

Features

                 

♦Low inductance structure reproduces an

         

  ideal waveforms.

               

♦Test time is reduced drastically by high

           

  speed waveform analysis.

             
                   
                   
                   
                   

                                                                                                                                                                            

 

 

 

 

 

 

 

Switching Time Test

I-Short Test

trr Test

VCE

301,500 V(1V Step)

301,500 V(1V Step)

301,500 V(1V Step)

IC

1300 A(1A Step) 

11,000 A(1A Step)

1300 A(1A Step)

IC Trip

1300 A(1A Step) 

 

1300 A(1A Step)

IC max

11,000 A(1A Step) 

11,000 A(1A Step)

11,000 A(1A Step)

VGE

±30.0 V(0.1V Step)

±30.0 V(0.1V Step)

±30.0 V(0.1V Step)

RG

1250Ω(1Ω Step) 

1250Ω(1Ω Step)

1250Ω(1Ω Step)

Pulse

Single/Double 

Single

Double

T1

000.1μ50.0 ms(0.1μs Step)

000.150.0μs(0.1μs Step)

000.1μ50.0 ms(0.1μs Step)

T2

000.1999.9μs(0.1μs Step)

000.1999.9μs(0.1μs Step)

T3

000.1999.9μs(0.1μs Step) 

000.1999.9μs(0.1μs Step)

R Load

Plug in 

L Load

Plug in

Plug in

Pre check

GS Short/Open/Short/Leak

GS Short/Open/

Vdsf(D.U.T)/ GS Short /

Short/Leak

Open/Short/Leak(Dummy)

Post check 

Leak

Leak 

Leak(Dummy) 

Test Item

td(on)/td(off)/ton/toff/

SC

trr/ trr1/ trr2/ Irr/ Qrr/ Qrr1/  

tr/tf/Eon/Eoff/IC0 

Qrr2/ IF/ dIF/dt/ dI(rec)M/dt

Test Time 

230 ms

140 ms

250 ms

DSO

LT364(LeCroy) 

LT364(LeCroy)

*For details specification of each product, please contact us.

 

 

 

                     

 

 

 

 

 

 

                                                           

 

 

 

 

 

 

 

 

 

 



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