3430-SW
The Dynamic Test System 3430-SW measures dynamic characteristics or AC test for IGBT/MOSFET devices at high speed.
Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items (normal 2stations).
One PC controls the whole system.
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Features
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♦Low inductance structure reproduces an
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ideal waveforms.
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♦Test time is reduced drastically by high
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speed waveform analysis.
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Switching Time/AC Test
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I-Short Test
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trr Test
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VCE
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30～1,500 V(1V Step)
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30～1,500 V(1V Step)
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30～1,500 V(1V Step)
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IC
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1～300 A(1A Step)
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1～1,000 A(1A Step)
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1～300 A(1A Step)
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IC Trip
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1～300 A(1A Step)
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－
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1～300 A(1A Step)
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IC max
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1～1,000 A(1A Step)
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1～1,000 A(1A Step)
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1～1,000 A(1A Step)
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VGE
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±30.0 V(0.1V Step)
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±30.0 V(0.1V Step)
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±30.0 V(0.1V Step)
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RG
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1～250Ω(1Ω Step)
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1～250Ω(1Ω Step)
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1～250Ω(1Ω Step)
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Pulse
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Single/Double
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Single
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Double
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T1
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000.1μ～50.0 ms(0.1μs Step)
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000.1～50.0μs(0.1μs Step)
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000.1μ～50.0 ms(0.1μs Step)
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T2
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000.1～999.9μs(0.1μs Step)
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－
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000.1～999.9μs(0.1μs Step)
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T3
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000.1～999.9μs(0.1μs Step)
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－
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000.1～999.9μs(0.1μs Step)
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R Load
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Plug in
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－
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－
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L Load
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Plug in
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－
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Plug in
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Pre check
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GS Short/Open/Short/Leak
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GS Short/Open/
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Vdsf(D.U.T)/ GS Short /
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Short/Leak
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Open/Short/Leak(Dummy)
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Post check
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Leak
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Leak
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Leak(Dummy)
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Test Item
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td(on)/td(off)/ton/toff/
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SC
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trr/ trr1/ trr2/ Irr/ Qrr/ Qrr1/
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tr/tf/Eon/Eoff/IC0
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Qrr2/ IF/ dIF/dt/ dI(rec)M/dt
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Test Time
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230 ms
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140 ms
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250 ms
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DSO
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12bits HD04104A (LeCroy)
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－
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12 bits HD04104A (LeCroy)
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*For details specification of each product, please contact us.
   
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