Internal Gate Resistance Tester

3041-R

 

The Tester 3041-R measures the internal gate resistance of MOSFET.
This tester is equipped with CONTACT CHECK and OPEN / SHORT test functions, and performs high volume production testing.

 

Features

               

♦Single or dual die MOSFET device test

http://en.tesec.co.jp/products/3041r/?action=common_download_main&upload_id=1277

 
     

♦N channel, P channel or combination device test

       

♦Standard Tester / Handler interface

         

♦Kelvin test with 100 mA constant current

       

♦Device Functional pre-test [Open/short]

       

♦Auto or Manual test operation

         

♦User-friendly interface, datalogging, program editor, 

     

  and test summary

             

♦Networking capability (option)

         

Simple calibration procedure.

         

 

 

Parameter 

Range

Resolution

Unit

Internal gate resistanceRg

0.5 99.9

0.1

Ohms

Sine wave source

0.1 3.0(1.0Vpp)

0.000365

MHz

DC constant current source

100

N/A

mA

Input D.U.T. capacitance

400 20000

N/A

pF

Test time

60 110

N/A

ms

*For details specification of each product, please contact us.

   

 

 

 

                       

 



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