Discrete Device Test System
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| 431-TT is a DC Parametric Test System with V/I | ||||
| Source Measurement Modules. | ||||
| This model is designed for Power Device testing and | ||||
| features high-speed test measurement and data | ||||
| capture, parallel device testing, auto-calibration, and | ||||
| an on-screen Waveform Monitor. | ||||
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| 881-TT Ver. AF is a High Performance DC Parametric | ||||
| Test System covers wide range of discrete semiconductor | ||||
| devices from small signal devices to power devices. | ||||
| 881-TT Ver AF is a single tester while 381-TT Ver PF | ||||
| is for parallel test. | ||||
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471-TT is a Tesec latest parallel tester for wafer test process. It can be configuerd for up to max 16 parallel sites with test capacity of 2kV/20A. | |||
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