Discrete Device Test System

 
     
      431-TT is a DC Parametric Test System with V/I 
      Source Measurement Modules. 
      This model is designed for Power Device testing and 
      features high-speed test measurement and data
      capture, parallel device testing, auto-calibration, and 
      an on-screen Waveform Monitor.
      Read more >
       
       
 
     
      881-TT/A is a High Performance DC Parametric Test 
      System covers wide range of discrete semiconductor 
      devices from small signal devices to power devices. 
      Model 881-TT/A is a single test mode system and 
      381-TT/P is a parallel test mode system.
      Read more >
       
       
       
http://en.tesec.co.jp/products/discrete/351ttp/?action=common_download_main&upload_id=697
 
     
      341-TT/P and 351-TT/P are Parallel DC Parametric
      Test System. Capability to perform parallel testing of 
      power discrete devices.
      341-TT/P has 1.2kV/20A capability.
      351-TT/P has 2kV/50A capability.
      Read more >
       
       
http://en.tesec.co.jp/products/discrete/391tt/?action=common_download_main&upload_id=698
 
     
      971-TT/B performs parallel testing of 4-pin small
      signal devices.
      391-TT has a capability up to 10A and performs 
      synchronous testing in addition to parallel testing.
      Read more >
       

 

 

 

            



Print

Event Calender

Latest News

>> View All