Discrete Device Test System
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431-TT is a DC Parametric Test System with V/I | ||||
Source Measurement Modules. | ||||
This model is designed for Power Device testing and | ||||
features high-speed test measurement and data | ||||
capture, parallel device testing, auto-calibration, and | ||||
an on-screen Waveform Monitor. | ||||
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881-TT/A is a High Performance DC Parametric Test | ||||
System covers wide range of discrete semiconductor | ||||
devices from small signal devices to power devices. | ||||
Model 881-TT/A is a single test mode system and | ||||
381-TT/P is a parallel test mode system. | ||||
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The new 471-TT is a DC tester with a new concept that realizes simultaneous measurement of plural chips in the wafer process. | ||||
471-TT has 2kV/20A capability. | ||||
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MAY '1605
TESEC Recognized as Outstanding Supplier for 2015
Tesec Corporation (Tesec) a world leader in semiconductor test and handler systems has...
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