4031-IH
Pick and Place Handler
The 4031-IH is a Handler for testing electrical characteristics of devices (QFP,BGA,CSP,QFN). Interfacing with a tester, the handler supplies device from tray to test station and sorts to 2 unloading trays according to the test.
Model |
4031-IH |
Applicable Package |
QFP,QFN,CSP,BGA,LGA,SOP,SSOP |
Applicable Package Sizes |
3-45mm |
Max Throughput(pcs/h) |
720 |
Cycle Time |
10s/2pcs |
Test Time included (sec) |
6.5 |
Test Station |
2 |
Contactor Type |
Socket |
Sort Categories (Max) |
2 |
Feeding |
Tray |
Sorting |
Tray |
*For details, please refer to the standard specification sheets of each product.
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MAY '1605
TESEC Recognized as Outstanding Supplier for 2015
Tesec Corporation (Tesec) a world leader in semiconductor test and handler systems has...
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