Map Test Handler

Film Frame Strip Test Handler (MAP Handler)

4170-IH

4170-IH is Film Frame Strip Test handler for QFN and WLCSP. Devices are electrically isolated but keep the block state on the wafer ring and tested before being singulated to tray or tube.
The strip testing method is ideal solution for small (less than 3x3). very thin leadless device and has high flexibility for package conversion.

FEATURES

 

♦High throughput 

     

 

       

♦High withstand load, and high thrust table 

         

♦Expansion of the strip attachment area:

           

  260(L) X 300(W) [Withinφ300mm for WLCSP]

       

♦LOT control by barcode/2D code reader 

         

♦Easy device type exchange only test socket and

         

  display screen setting

             

♦Auto-cleaning function unit is installed to

         

  clean the socket at any desired timing.

           

♦8/12 inches ring conversion 

             

♦S2/S8 regulation compliance

           

♦SEMI G85 compliance

             

♦SECS/GEM compliance 

             

♦Hot temperature test is available : 125C 

         

 

Model

4170-IH

 Applicable device

QFN, DFN, CSP, BGA, BCC, LLP, WLCSP

Applicable ring sizes

8 / 12 inches

 Test station

Multi-parallel

 Contact method

Pogo-pin or specified contactor

 Supply ring capacity

1 cassette(Wafer ring 25 pcs/8 inches, 13 pcs/12 inches)

Stock ring capacity

1 cassette(Wafer ring 25 pcs/8 inches, 13 pcs/12 inches)

Hot temperature test

MAX 125C

*Please refer to the standard specification sheets of each product.

 

 

 

 

                     



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